Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope
Source abstract
Abstract
Markus Lentzen, Chun Lin Jia, Knut Urban; Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanal
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques
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References
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