journal article·2008-08

Remote Teaching for Electron Microscopy

TC Isabell, Y Ohkura, T Kobayashi, RM O'Donnell

Microscopy and Microanalysis· Volume 14· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Nanotechnology research and applications

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References

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