DataVXMicroscopy and MicroanalysisPaper
journal article·2010-07

Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument

M Terauchi, H Takahashi, N Handa, T Murano, M Koike, T Kawachi, T Imazono, M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto

Microscopy and Microanalysis· Volume 16· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Semiconductor materials and interfaces

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References

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