A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology
Source abstract
Abstract
A Liebel, G Lutz, U Weber, A Niculae, H Soltau; A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology, Microscopy an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques · Advancements in Semiconductor Devices and Circuit Design
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