DataVXMicroscopy and MicroanalysisPaper
journal article·2012-07

Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement

T. Hashimoto, S. Mamishin, A. Mouri, A. Watabe, M. Kondo, M. Okada, T. Wada, H. Mise, T. Oyagi, T. Yotsuji, Y. Nodera, E. Nakazawa

Microscopy and Microanalysis· Volume 18· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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