DataVXMicroscopy and MicroanalysisPaper
journal article·2012-07

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

J. Wen, D.J. Miller, N.J. Zaluzec, J.M. Hiller, R.E. Cook, A.B. Shah, J. Zuo

Microscopy and Microanalysis· Volume 18· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Ion-surface interactions and analysis · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques

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References

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