DataVXMicroscopy and MicroanalysisPaper
journal article·2004-08

Cs Corrector for Illumination

Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne

Microscopy and Microanalysis· Volume 10· Issue S02
Publisher page
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced X-ray Imaging Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.