Applying the Dynamic Transmission Electron Microscope to Study Fast Processes in Materials

GH Campbell; TB LaGrange; WE King; ND Browning; MR Armstrong; JS Kim; BW Reed; AM Frank; BC Stuart; WJ DeHope; BJ Pyke; RM Shuttlesworth; FV Hartemann; DJ Gibson

doi:10.1017/s1431927606063926

journal article·2006-08Open access

Applying the Dynamic Transmission Electron Microscope to Study Fast Processes in Materials

GH Campbell, TB LaGrange, WE King, ND Browning, MR Armstrong, JS Kim, BW Reed, AM Frank, BC Stuart, WJ DeHope, BJ Pyke, RM Shuttlesworth, FV Hartemann, DJ Gibson

Microscopy and Microanalysis· Volume 12· Issue S02

Publisher page Open full text

Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Only a short abstract or summary was supplied by the source.

Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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References

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