journal article·2011-07Open access

A to Z of Technology - Software for Better Results with Faster Sensors

S Burgess, J Goulden, A Hyde, D Redfern, N Rowlands

Microscopy and Microanalysis· Volume 17· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Machine Learning in Materials Science · Nuclear Physics and Applications · Advanced X-ray and CT Imaging

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References

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