DataVXMicroscopy and MicroanalysisPaper
journal article·2009-07

Three-Dimensional Characterization of Polycrystalline Materials by Combination of X-ray Diffraction and X-ray Imaging Techniques

EM Lauridsen, W Ludwig, SO Poulsen, S Rolland du Roscoat, P Reischig, A King, A Lyckegaard, RW Fonda

Microscopy and Microanalysis· Volume 15· Issue S2
Publisher page
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Advanced X-ray Imaging Techniques · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.