Low Vacuum Scanning Electron Microscopy, a Novel Technique for Integrated Microscopic Evaluation of Implantable Devices
Source abstract
Abstract
F J Clubb,, Jr, M R Coscio, R Nichols, A Rossi, L Stagnoli, S Sedlik, E Koullick, M Bergan, E Fogt, M Petersen, C B McClay; Low Vacuum Scanning Electron Mi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques
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