Observing a p-n Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography and Focused-Ion-Beam Milling
Source abstract
Abstract
Z Wang, K Sasaki, T Hirayama, Y Yabuuchi, H Saka; Observing a p-n Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography an
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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