journal article·2003-08Open access

New Detection Principles on the GEMINI SUPRA FE-SEM

Heiner Jaksch, Michael Steigerwald, Volker Drexel, Hans Bihr

Microscopy and Microanalysis· Volume 9· Issue S02

Abstract

Heiner Jaksch, Michael Steigerwald, Volker Drexel, Hans Bihr; New Detection Principles on the GEMINI SUPRA FE-SEM, Microscopy and Microanalysis, Volume 9,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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