Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges
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Abstract
Nicolas Brodusch, Raynald Gauvin; Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges, Microscopy and Microanaly
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Semiconductor materials and interfaces
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References (4)
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3. Egerton · 201110.1007/978-1-4419-9583-4 ↗
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