Calibration-less quantitative 4D-STEM imaging of amorphous samples
Source abstract
Abstract
Radim Skoupy, Vladislav Krzyzanek; Calibration-less quantitative 4D-STEM imaging of amorphous samples, Microscopy and Microanalysis, Volume 27, Issue S1, 1
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References (4)
Show source-provided references
1. Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination10.1111/j.1365-2818.2010.03475.x ↗
2. Mapping structure and morphology of amorphous organic thin films by 4D-STEM pair distribution function analysis10.1093/jmicro/dfz015 ↗
3. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond10.1017/S1431927619000497 ↗
4. Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sections10.1016/j.ultramic.2019.03.018 ↗