Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples
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Abstract
Journal Article Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples Get access Ben Miller, Ben Miller Gatan Inc. Pleasanton, CA, USA Corresponding author: BMiller@gatan.com Search for other works by this author on: Oxford Academic Google Scholar Anahita Pakzad, Anahita Pakzad Gatan Inc. Pleasanton, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Stephen Mick Stephen Mick Gatan Inc. Pleasanton, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1718–1719, https://doi.org/10.1017/S1431927619009322 Published: 01 August 2019
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (4)
Show source-provided references
1. 10.1038/nmat485210.1038/nmat4852 ↗
2. The nano-diamond sample used in this work was kindly provided by Dr. Shery Chang (ASU)
3. 10.1038/nmeth.247210.1038/nmeth.2472 ↗
4. 10.1016/j.micron.2014.07.00910.1016/j.micron.2014.07.009 ↗