In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope
Source abstract
Abstract
reflects the in-plane magnetic field in the sample. The magnetic phase information with 0.47 nm spacing corresponding to the (111) lattice were obtained. By the multi-slice simulation including atomic-scale magnetic field derived by the Vienna Ab initio simulation package (VASP) calculation, it is shown that the observed result does reflect the atomic-layer in-plane magnetic field distributions.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Magnetic properties of thin films · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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References (6)
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1. Development of the 1.2-MV holography electron microscope was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)” initiated by the Council for Science, Technology, and Innovation (CSTI). Part of this research was supported by JST CREST Grant Number JPMJCR1664, Japan.
2. 10.1093/oxfordjournals.jmicro.a02361210.1093/oxfordjournals.jmicro.a023612 ↗
3. 10.1038/s41598-017-16519-710.1038/s41598-017-16519-7 ↗
4. 10.1103/PhysRevB.61.42210.1103/PhysRevB.61.422 ↗
5. 10.1063/1.490817510.1063/1.4908175 ↗
6. 10.1016/bs.aiep.2016.08.00410.1016/bs.aiep.2016.08.004 ↗