In situ TEM Investigation of the Electroplasticity Phenomenon in Metals
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Abstract
Journal Article In situ TEM Investigation of the Electroplasticity Phenomenon in Metals Get access Xiaoqing Li, Xiaoqing Li University of California Berkeley, Department of Materials Sciences and Engineering, Berkeley, USANational Center for Electron Microscopy (NCEM) at Molecular Foundry, Lawrence Berkeley National Laboratory (LBNL, LBL), Berkeley, CA, USA Xiaoqing Li: li_xiaoqing@berkeley.edu Search for other works by this author on: Oxford Academic Google Scholar Andrew M Minor Andrew M Minor University of California Berkeley, Department of Materials Sciences and Engineering, Berkeley, USANational Center for Electron Microscopy (NCEM) at Molecular Foundry, Lawrence Berkeley National Laboratory (LBNL, LBL), Berkeley, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1832–1833, https://doi.org/10.1017/S1431927619009899 Published: 01 August 2019
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OpenAlex topics: Electromagnetic Effects on Materials · Non-Destructive Testing Techniques · Semiconductor materials and interfaces
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References (5)
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5. The authors gratefully acknowledge funding from the US Office of Naval Research under Grant No. N00014-17-1-2283. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.