Visualizing Astigmatism in the SEM Electron Probe

Mandy C. Nevins; Matthew D. Zotta; Richard K. Hailstone; Eric Lifshin

doi:10.1017/s1431927618003513

journal article·2018-08Open access

Visualizing Astigmatism in the SEM Electron Probe

Mandy C. Nevins, Matthew D. Zotta, Richard K. Hailstone, Eric Lifshin

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

Mandy C Nevins, Matthew D Zotta, Richard K Hailstone, Eric Lifshin; Visualizing Astigmatism in the SEM Electron Probe, Microscopy and Microanalysis, Volume

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

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1. 10.1017/S143192761700130110.1017/S1431927617001301 ↗

2. Microscopy Today · 2017 · 25 · 18

3. 10.1017/S143192761700131310.1017/S1431927617001313 ↗