Composition and Thickness Mapping Using STEM EDS
Source abstract
Abstract
Meiken Falke, Johanna Kraxner, Ralf Terborg, Gerald Kothleitner, Werner Grogger; Composition and Thickness Mapping Using STEM EDS, Microscopy and Microanal
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/0304-3991(94)90079-510.1016/0304-3991(94)90079-5 ↗
2. 10.1017/S143192761200146810.1017/S1431927612001468 ↗
3. Microsc. Microanal · 2014 · 20 · 678
4. 10.1111/j.1365-2818.2006.01549.x10.1111/j.1365-2818.2006.01549.x ↗