Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis

Correlative microscopy allows us to identify sites-of-interest across different length scales and perform both structural and chemical analysis by combining the use of light, electrons and x-ray photons. It becomes an essential method to address questions for both biological and materials sciences. We have presented here example studies as well as the challenges of using synchrotronbased x-ray fluorescence microscopy (SXFM) as a complementary tool to either light microscopy (LM) or transmission electron microscopy (TEM) for trace element analysis.