journal article·2018-08Open access

High-Resolution Full-Field X-ray Microscope for 20-keV X-rays with Multilayer Imaging Mirrors

Satoshi Matsuyama, Jumpei Yamada, Kentaro Hata, Yoshiki Kohmura, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi

Microscopy and Microanalysis· Volume 24· Issue S2

Abstract

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications

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References (3)

Show source-provided references
1. 10.1364/AO.56.00096710.1364/AO.56.000967 ↗
2. 10.1038/srep4635810.1038/srep46358 ↗
3. 10.1364/OE.23.02903210.1364/OE.23.029032 ↗