Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy
Source abstract
Abstract
Colin Ophus, Thomas Juffmann, Stewart A Koppell, Brannon B Klopfer, Robert Glaeser, Mark A Kasevich; Reducing Electron Beam Damage with Multipass Transmission E
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Near-Field Optical Microscopy
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References (6)
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1. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. This research was also supported by the Gordon and Betty Moore Foundation and the Stanford Graduate Fellowship..
2. 10.1016/j.ultramic.2016.03.00410.1016/j.ultramic.2016.03.004 ↗
3. Wagner · eLife · 2016 · 5 · e1706310.7554/eLife.17063 ↗
4. Juffmann T , et al, Multi-pass Transmission Electron Microscopy (2016).10.1038/s41598-017-01841-x ↗
5. 10.1103/PhysRevLett.96.01040110.1103/PhysRevLett.96.010401 ↗
6. 10.1126/science.110414910.1126/science.1104149 ↗