Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM
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Abstract
M Watanabe, T Sasaki, Y Jimbo, E Okunishi, H Sawada; Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Qua
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
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References (1)
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1. 10.1016/0304-3991(94)90079-510.1016/0304-3991(94)90079-5 ↗