Secondary Electron Yield at High Voltages up to 300 keV
Source abstract
Abstract
Jane Howe, David Hoyle, Kota Ueda, Stas Dogel, Hooman Hosseinkhannazer, Matthew Reynolds, Rene Veillette, Michel L Trudeau, David Joy; Secondary Electron Y
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Advancements in Photolithography Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Nano Research Letters · 2014 · 9
2. 10.1016/j.jpowsour.2012.08.02610.1016/j.jpowsour.2012.08.026 ↗
3. 10.1063/1.33284010.1063/1.332840 ↗
4. 10.1088/0022-3727/10/5/02210.1088/0022-3727/10/5/022 ↗
5. 10.1002/sia.210710.1002/sia.2107 ↗
6. 10.1038/nmat253210.1038/nmat2532 ↗