Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Testing
Source abstract
Abstract
Tobias Volkenandt, Alexandre Laquerre, Michal Postolski, Fabian Perez-Willard; Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Test
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Microstructure and mechanical properties · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. Mat Sci. Eng. A · 2005 · 400–401 · 268
2. 10.1016/j.actamat.2004.12.03110.1016/j.actamat.2004.12.031 ↗
3. 10.1016/j.actamat.2005.05.02310.1016/j.actamat.2005.05.023 ↗