journal article·2014-08Open access

In Situ STEM of Ag and Cu Conducting Bridge Formation through Al2O3 in Nanoscale Resistive Memory Devices

William A. Hubbard, E. R. White, Alexander Kerelsky, Jared J. Lodico, B. C. Regan

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

William A Hubbard, E R White, Alexander Kerelsky, Jared J Lodico, B C Regan; In Situ STEM of Ag and Cu Conducting Bridge Formation through Al2O3 in Nanosca
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Electronic and Structural Properties of Oxides · Semiconductor materials and devices

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References

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