Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED
Source abstract
Abstract
R dos Reis, C Ophus, J Ciston, P Ercius, U Dahmen; Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED, Microscopy and Microa
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices
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References (3)
Show source-provided references
1. 10.1103/PhysRevB.73.20520310.1103/PhysRevB.73.205203 ↗
2. 10.1107/S205327331408544110.1107/S2053273314085441 ↗
3. 10.1016/j.ultramic.2009.10.00110.1016/j.ultramic.2009.10.001 ↗