DataVXMicroscopy and MicroanalysisPaper
journal article·2011-07Open access

Probing Stoichiometry in LaAlO3/SrTiO3 Interfaces by Aberration-Corrected STEM

J Mundy, L Fitting Kourkoutis, M Warusawithana, D Schlom, D Muller

Microscopy and Microanalysis· Volume 17· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques · Semiconductor materials and devices

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