journal article·2003-09

Kossel X-ray Microdiffraction and EBSD as Complementary Methods in the SEM

E. Langer, S. Däbritz, W. Hauffe

Microscopy and Microanalysis· Volume 9· Issue S03
Publisher page

Abstract

E Langer, S Däbritz, W Hauffe; Kossel X-ray Microdiffraction and EBSD as Complementary Methods in the SEM, Microscopy and Microanalysis, Volume 9, Issue S0
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Diffraction in Crystallography · Machine Learning in Materials Science

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References

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