STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
Source abstract
Abstract
Peter D Nellist, Hao Yang, Juan G Lozano, Timothy J Pennycook, Peter B Hirsch; STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Near-Field Optical Microscopy
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References
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