journal article·2014-08Open access

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

P. A. Crozier, J. Zhu, T. Aoki, P. Rez, W. J. Bowman, R.W. Carpenter, O.L. Krivanek, N. Dellby, T.C. Lovejoy, R.F. Egerton

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

P A Crozier, J Zhu, T Aoki, P Rez, W J Bowman, RW Carpenter, OL Krivanek, N Dellby, TC Lovejoy, RF Egerton; Challenges and Opportunities in Materials Scien
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis

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