DataVXMicroscopy and MicroanalysisPaper
journal article·2011-07Open access

Recent Advances in Liquid-phase Electron-Beam Induced Deposition: Characterizing Growth Processes and Optical Properties

E Donev, N Nehru, G Schardein, J Wright, A Chamberlain, C Samantaray, J Hastings

Microscopy and Microanalysis· Volume 17· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

Materials processing

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis

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