DataVXMicroscopy and MicroanalysisPaper
journal article·2011-07Open access

Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield

T Prosa, D Lawrence, D Olson, D Lenz, J Bunton, D Larson

Microscopy and Microanalysis· Volume 17· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Electronic and Structural Properties of Oxides

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