DataVXMicroscopy and MicroanalysisPaper
journal article·2011-07Open access

Quantitative Analysis of Chemical Composition Using HAADF-STEM in a JEOL 2200FS

R Fritz, A Beyer, W Stolz, K Müller, M Schowalter, A Rosenauer, I Häusler, H Kirmse, A Mogilatenko, H Kirmse, W Neumann, K Volz

Microscopy and Microanalysis· Volume 17· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Nuclear Physics and Applications

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