Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

M Ellisman; T Deerinck; E Bushong; J Bouwer; T Shone; L Jin; A Milazzo; S Peltier; N-H Xuong

doi:10.1017/s1431927611005757

journal article·2011-07Open access

Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

M Ellisman, T Deerinck, E Bushong, J Bouwer, T Shone, L Jin, A Milazzo, S Peltier, N-H Xuong

Microscopy and Microanalysis· Volume 17· Issue S2

Publisher page Open full text

Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Only a short abstract or summary was supplied by the source.

Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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