Phase Contrast and HAADF Imaging of Structures in In2O3–ZnO Compounds in CS-Corrected Electron Microscopes
Source abstract
Abstract
Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · ZnO doping and properties · Chalcogenide Semiconductor Thin Films
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References
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