TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
Source abstract
Abstract
Tim Dahmen, Jean-Pierre Baudoin, Andrew R Lupini, Christian Kübel, Philipp Slusallek, Niels de Jonge; TFS: Combined Tilt- and Focal Series Scanning Transmi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References
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