journal article·2003-08Open access

State of the first aberration-corrected, monochromized 200kV FEG-TEM

Gerd Benner, Alexander Orchowski, Max Haider, Peter Hartel

Microscopy and Microanalysis· Volume 9· Issue S02

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.