Development of LVSEM-EDS Analyzer Utilizing Superconducting X-ray Detector Toward Nanometer-scale Elemental Mapping of CFRP/Adhesive Interface
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OpenAlex topics: Superconducting and THz Device Technology · Silicon Carbide Semiconductor Technologies · Surface and Thin Film Phenomena
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References (5)
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1. This work was supported by Innovative Science and Technology Initiative for Security, ATLA, Japan.
2. 10.1002/xrs.279610.1002/xrs.2796 ↗
3. 10.1088/1757-899X/109/1/01201910.1088/1757-899X/109/1/012019 ↗
4. 10.1016/j.nima.2010.04.03810.1016/j.nima.2010.04.038 ↗
5. 10.1007/s10909-016-1488-x10.1007/s10909-016-1488-x ↗