Outline of an Ultracorrector Compensating for all Primary Chromatic and Geometrical Aberrations of Charged-Particle Lenses
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Abstract
Journal Article Outline of an Ultracorrector Compensating for all Primary Chromatic and Geometrical Aberrations of Charged-Particle Lenses Get access H Rose H Rose Institute of Applied Physics, Darmstadt University of Technology, Hochschulstraße 6, D-64289 Darmstadt, Germany. E-mail: rose@ltoi.iap.physik.tu-darmstadt.de Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S03, 1 September 2003, Pages 32–33, https://doi.org/10.1017/S1431927603011164 Published: 05 September 2003
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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