Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How?
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Abstract
Jian-Min Zuo, Yu-Tsun Shao; Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How?, Microscopy and Microanalys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Crystallography and Radiation Phenomena · X-ray Diffraction in Crystallography
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References (6)
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1. 10.1016/j.micron.2015.01.00210.1016/j.micron.2015.01.002 ↗
2. 10.1103/PhysRevLett.118.15760110.1103/PhysRevLett.118.157601 ↗
3. 10.1088/0034-4885/67/11/R0310.1088/0034-4885/67/11/R03 ↗
4. 10.1107/S160057671700326010.1107/S1600576717003260 ↗
5. Acta Crystallographica Section A · 1999 · 55 · 93910.1107/S0108767399005401 ↗
6. 2017