journal article·2017-07Open access

Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment

Takeo Sasaki, Shigeyuki Morishita, Yuji Kohno, Masaki Mukai, Koji Kimoto, Kazu Suenaga

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Takeo Sasaki, Shigeyuki Morishita, Yuji Kohno, Masaki Mukai, Koji Kimoto, Kazu Suenaga; Performance of Low-kV Aberration-corrected STEM with Delta-correcto
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (2)

Show source-provided references
1. 10.1103/PhysRevLett.117.15300410.1103/PhysRevLett.117.153004 ↗
2. 10.1093/jmicro/dfq02710.1093/jmicro/dfq027 ↗