A New SEM Column Combining Ultra-High Resolution and Flexible Scanning
Source abstract
Abstract
Petr Sytaf, Jaroslav Jiruse, Adam Zavodny; A New SEM Column Combining Ultra-High Resolution and Flexible Scanning, Microscopy and Microanalysis, Volume 23,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192761600374310.1017/S1431927616003743 ↗
2. Wide field optics description at www.tescan.com.