journal article·2016-07Open access

Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF

M. Watanabe, T. Nakamura, T. Ishikawa

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

M Watanabe, T Nakamura, T Ishikawa; Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF, Microscopy and Microanaly
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Nuclear Physics and Applications · Advanced Electron Microscopy Techniques and Applications · Laser-Plasma Interactions and Diagnostics

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References (1)

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1. 10.1007/978-1-4419-7200-2_710.1007/978-1-4419-7200-2_7 ↗