Nanoscale Imaging of Structural and Optical Properties Using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence of Nitride Based Nanostructures
Source abstract
Abstract
Frank Bertram, Marcus Müller, Gordon Schmidt, Peter Veit, Silke Petzold, Steven Albert, Ana María Bengoechea-Encabo, Miguel Ángel Sánchez-Garcia, Enrique C
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films
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