Atomic Column Elemental Mapping by STEM-Moire Method
Source abstract
Abstract
Eiji Okunishi, Noriaki Endo, Yukihito Kondo; Atomic Column Elemental Mapping by STEM-Moire Method, Microscopy and Microanalysis, Volume 20, Issue S3, 1 Aug
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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