The superSTEM: An Aberration Corrected Analytical Microscopy Facility
Source abstract
Abstract
A Bleloch, LM Brown, R Brydson, A Craven, P Goodhew, C Keily; The superSTEM: An Aberration Corrected Analytical Microscopy Facility, Microscopy and Microan
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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