Zernike Phase Contrast Electron Microscopy with a Spherically Corrected Foil Lens
Source abstract
Abstract
Abstract A lens system is proposed that not only provides spherical correction of the objective lens by charges that are induced on a thin foil, in the way proposed in a paper by Otto Scherzer [Optik56(2), 133–147, 1980], but also provides Zernike phase contrast by means of an appropriate phase shift of the scattered electrons within the foil. This system has the potential to provide strong phase contrast from very low spatial frequencies to frequencies above 1/(100 pm).
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. Third order spherical aberration and axial chromatic aberration of rotationally symmetric electron lenses with spherically curved charged transparent foils
2. Correction of the spherical aberration of a magnetic lens with a foil lens
3. 10.1016/S0304-3991(98)00048-510.1016/S0304-3991(98)00048-5 ↗
4. Eine sphärisch korrigierte Folien-Linse für die Phasenmikroskopie mit Elektronen
5. Die Strahlenschädigung der Objekte als Grenze für die hochauflösende Elektronenmikroskopie. Berichte der Bunsengesellschaft für physikalische10.1002/bbpc.19700741113 ↗
6. 10.2142/biophysics.2.3510.2142/biophysics.2.35 ↗
7. Das praktische Auflösungsvermögen von Elektronenmikroskopen
8. 10.1063/1.169823310.1063/1.1698233 ↗
9. Sphärische und chromatische Korrektur von Elektronenlinsen mit Hilfe von Influenzladungen, II
10. Sphärische und chromatische Korrektur von Elektronenlinsen mit Hilfe von Influenzladungen, I
11. 10.1016/j.ultramic.2008.12.00610.1016/j.ultramic.2008.12.006 ↗