Plasmon-Ratio Imaging: A Technique for Enhancing the Contrast of Second Phases with Reduced Diffraction Contrast in TEM Micrographs
Source abstract
Abstract
A technique is proposed for reducing unwanted diffraction contrast when imaging second phases in crystalline materials using transmission electron microscopy. With the suggested name of plasmon-ratio imaging, the technique uses an energy-filtered imaging system to record and determine a ratio for two images taken at energies in the low loss region. Unlike core-loss imaging, the use of very thin specimens is not required. It is concluded that it is often possible to create a ratio image in which the contrast is dominated by energy loss, that is, chemical differences, rather than by diffraction effects.
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (8)
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